The Dimension Icon Scanning Probe Microscope (SPM) produces high-resolution, three-dimensional images by scanning a sharp tip over a sample surface. The tip is part of a probe mounted on one end of a cylindrical piezoelectric tube mounted near the top of the microscope. Voltages applied to the X and Y electrodes on the piezoelectric tube deflect the tube horizontally to produce a precise raster scan over the sample surface. A voltage applied to the Z electrodes on the piezo tube controls the vertical height of the tip. The Dimension Icon scanner includes X,Y and Z position sensors. The sensed XYZ position information provides the feedback for closed loop control of probe tip location, ensuring that the probe completes each move command at the intended position. Stepper motors coupled to lead screws translate slides with the sample attached. A separate motor drive controls the height of the microscope and tip relative to the sample surface.
For general information about SPM functioning, refer to the SPM Training Guide.
The full workstation configuration includes the computer, NanoScope V controller, air table, and Dimension Icon SPM:
The system is also available with the optional VT-1000 air table (Dimension Icon-PI configuration) in place of theAVH-1000 air table with integrated hood, and without the electronics cabinet.
The various Product Configurations provide options for acoustic and mechanical vibration isolation, as well as options for positioning control station components. The features outlined below apply to all configurations.
| www.bruker.com | Bruker Corporation |
| www.brukerafmprobes.com | 112 Robin Hill Rd. |
| nanoscaleworld.bruker-axs.com/nanoscaleworld/ | Santa Barbara, CA 93117 |
| Customer Support: (800) 873-9750 | |
| Copyright 2010, 2011. All Rights Reserved. |
Enhanced Motorized Positioning Stage